A STUDY OF DIGITAL SIGNAL PROCESSING ERRORS CAUSED BY IMPROPER ADC SETTINGS
By:
Timothy A. Mouch, Steve Akers
and John Hicks
Structural Measurement Systems, Inc.
Presented at the
4th International Modal Analysis Conference
February 3 - 6, 1986
A STUDY OF DIGITAL SIGNAL PROCESSING ERRORS CAUSED BY IMPROPER ADC SETTINGS
by:
TIMOTHY A. MOUCH
STRUCTURAL MEASUREMENT SYSTEMS
STEVE AKERS
FORD MOTOR COMPANY
ADVANCED VEHICLE ENGINEERING TECHNOLOGY
JOHN HICKS
FORD MOTOR COMPANY
ADVANCED VEHICLE ENGINEERING TECHNOLOGY
ABSTRACT
This paper will discuss the effects of digital signal
processing errors caused by improper analog to digital conversion
settings. Four signal types will be analyzed: overload and underload
on the input channel; and, overload and underload on the response
channel. The errors will be shown to affect the quality and accuracy
of the measured frequency response function. The errors which
are present in the measurement will also be shown to exist as
an inaccurate estimate of the modal residue obtained through curvefitting.
INTRODUCTION
Through advances in the field of dynamic analysis,
structural analysts are able to predict the dynamic response of
a structure through an experimental modal test. This gives the
analyst a very powerful tool for structural modifications, providing
the results of the modal test are an accurate representation of
the dynamics of the structure.
The modal test can be divided into two parts:
1) Modal Data Acquisition, and
2) Modal Parameter Estimation
The first step of the modal data acquisition process
requires analog voltages representing structural response to be
converted to digital signals to conform to the requirements of
digital computers. This conversion is one of the first places
errors in modal data can occur. These errors will then be carried
through the entire test and can distort the results of the test.
However, the modal practitioner can minimize the
effects of the error once an error has been recognized. It is
the intent of this paper to characterize four ADC errors and show
the effect of the errors on the modal parameter estimation of
the residue term. This will then enable the modal practitioner
to recognize these ADC errors and the seriousness of each error
on the estimate of the residue term.
In order to speak of recognizing erroneous measurements
or sets of measurements, one must first define an accurate measurement
to be used for comparison. Figure 1 represents an accurate dynamic
description of an engine/powertrain assembly driving point function.
Figure 2 represents the coherence function
for the measurement in Figure 1.
The structure was excited with burst random noise.
The amplitude of the excitation was optimized to a 1 volt ADC
setting on the Fourier analyzer. The optimization entailed increasing
the amplitude of the signal until an ADC overflow occurred and
then reducing the amplitude just enough to avoid the overflow
completely.
A similar type optimization
was performed on the response channel, except only by adjusting
the gain of the power amplifier.
The first set of errors to be discussed will be ADC
overloading. ADC overloading can be defined as providing a signal
to the ADC greater than the available dynamic range of the current
ADC setting. Typically, an analyzer will have up to 80 dB of dynamic
range. An overload will occur if the dynamic range of the power
spectrum signal is greater than 80 dB. ADC overloads can occur
on either input or response channels.
An ADC overload on the input can be caused by the
range of the ADC set to .1 volts while maintaining a 1 volt input
signal. The frequency response function (frf) and coherence function
are shown in Figures 3 and 4, respectively. Overlayed on each
function is the measurement and coherence of the accurate measurement.

A comparison of the two frf's show substantial amplitude
differences between the two functions. This bias error represents
the "clipping" of the input signal. The amount of "clip"
is equivalent to the maximum level of the ADC. In this case, the
maximum level is .1 volts. This example has a 1 volt signal being
represented as a .1 volt signal. With the frf being a ratio of
the output to input, the analyst is effectively reducing the input
spectrum, thus reducing the value of the denominator term of the
function. This will account for the amplification of the function
as seen as the bias error in Figure 3.

Figure 3 also shows appreciable noise imbedded in
the function. This "rattiness" is caused by the Fourier
transform of the "clipped" signal. This signal will
cause jump discontinuities in the signal which will cause errors
when the time domain signal is transformed to the frequency domain
via the Fourier transform.
A similar overload condition can occur on the response
channel. The response signal is maintained at 1 volt and the ADC
setting is erroneously set at .1 volt. Figure 5 represents the
frf measured in this condition. The amplitude of the frf is biased
lower than the accurate measurement. This error is a function
again of the clipped signal's effect on the calculation of the
frequency response function. The "clipped" signal erroneously
reduces the amplitude of the response signal which comprises the
numerator term of the frf. This forces the ratio of the two signals
to be lower than an accurate measurement.
The frf of Figure 5 shows substantial noise off resonance. The noise
in the function is due to the truncated signal of the response
channel. Similar to an input overload, the truncation of the signal
force jump discontinuities in the time domain which will show
up as errors in the frequency domain.

Figure 6 represents another overload on the response
channel, only this time the 1 volt response signal is truncated
by a .25 volt ADC setting. In comparison to Figure 5, the severity
of the error can be directly correlated to the mismatch between
signal strength and the ADC setting. Figure 6 shows similar characteristics
to the measurement shown in Figure 5 only to a lesser degree of
error from the known accurate measurement.
The second error associated with ADC settings is
an underload. In an underload condition, the desired signal does
not fill the entire range of the ADC's available dynamic range.
The desired signal may actually reside in the noise making it
undistinguishable from the noise. The severity of this condition
is again dependent on the mismatch between signal strength and
the ADC setting.
An underload condition on the input spectrum is represented
in Figures 7 and 8. The measurement represents a mismatch between
the signal and ADC setting by a factor of 500. The frf represented
in Figure 7 is very similar to the overlayed accurate frf with
the exception of the noise off resonance. However, the coherence
function of Figure 8 show a degradation of the measurement throughout
the spectrum. This degradation and noisiness of the frf describe
the signal being lost in the noise floor of the input spectrum.
The time domain representation
of the signal will show digitized low level noise as the input.
The ratio of the input to output signals does not show direct
causality as evidenced in the coherence function.


The final error to be discussed is an underload condition
on the response channel. Figures 9 and 10 will show the frf and
coherence function of this condition, respectively. The measured
frf was acquired with the mismatch between the actual signal and
the ADC setting being a factor of 400. Analysis of the data shows
a noisy frf with poor coherence. The response signal is in the
noise and the frf ratios the noise as a numerator term which produces
noise off resonance and low coherence due to the effects of the
measured response (noise) not being caused by the input signal.


The effects of ADC errors have been seen and discussed
with respect to frequency response functions. However, it is important
also to realize the effects of the errors on the estimates of
the modal parameters. The measured frequency response functions
contain three resonances. These resonances occur at 10.36 Hz,
92.99 Hz and 122.50 Hz. A single degree of freedom polynomial
was used to estimate the modal parameters for each resonance.
Table 1 shows the estimates for the first resonance. DOF 1 Z corresponds
to an accurate measurement with the estimate of the residue amplitude
= .6511 G/lbsec. DOF 7 Z represents the estimate for an
overload on the input. The residue amplitude estimate is 1.026
G/lbsec. This represents a 57% amplitude error. DOF 13 Z
represents the overload on the response condition and is in error
by 57%. DOF 25 Z represents the estimate for the underload on
the input condition. The amplitude estimate is in error by 26%.
The underload on the response condition corresponds to DOF 29
Z and is in error by 36%.

Similar type curvefits were run on the second and
third resonance. These results are seen in Tables 2 and 3, respectively.


CONCLUSION
The ADC settings can have a very large effect on
the quality of a measurement. These errors are not always easily
detected if only the frequency response function is examined.
The purpose of this paper is to reemphasize the importance of
optimizing the ADC and amplifier settings for the best signal
to noise ratios. The errors caused by ADC mismatch to signal strength
are carried through to the parameter estimation process and can
be seen in the estimates of the amplitude of the residue term.
The amount of error present is directly proportional to the degree
of mismatch between the ADC setting and signal strength. The overload
errors have a more detrimental effect on the measurement than
the underload conditions. By recognizing each of these error types,
the analyst can better arm himself to make accurate measurements.
REFERENCES
1. Oppenheim, A. and R. Schafer, "Digital Signal Processing",
Prentice Hall, Englewood Cliffs, NJ, 585 pp.
2. Allemang, Zimmerman, Brown, "Techniques for Reducing
Noise in Frequency Response Measurements", ASME Winter Annual
Meeting, 12/16/79.
3. Wada, B.K., "Modal Test Measurement and Analysis
Requirements".
4. Ramsey, K., "Effective Measurements for Structural
Dynamic Testing", Sound and Vibration, Nov. 1975.
5. Ramsey, K., "Effective Measurements for Structural
Dynamic Testing, Part 2", Sound and Vibration, April 1976.
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